Characterization of Optical Constants for Uranium from 10 nm to 47 nm
نویسندگان
چکیده
Nicole Brimhall, Nicholas Herrick, David D. Allred, R. Steven Turley, Michael Ware, and Justin Peatross∗ Department of Physics and Astronomy, Provo, UT 84602 and ∗Corresponding author: [email protected] Abstract We use a laser-high-harmonics-based extreme ultraviolet polarimeter to determine the optical constants of elemental uranium in the wavelength range 10-47 nm. The constants are extracted from the measured ratio of p-polarized to s-polarized reflectance from a thin uranium film deposited in situ. The film thickness is inferred from a spectroscopic-ellipsometry measurement of the sample after complete oxidation in room air. Uranium has been used as a high-reflectance material in the EUV. However, difficulties with oxidation have prevented its careful characterization previous to this work. We find that measured optical constants for uranium vary significantly from previous estimates.
منابع مشابه
Characterization of optical constants for uranium from 10 to 47 nm.
We use a laser high-harmonics-based extreme-ultraviolet (EUV) polarimeter to determine the optical constants of elemental uranium in the wavelength range from 10 to 47 nm. The constants are extracted from the measured ratio of p-polarized to s-polarized reflectance from a thin uranium film deposited in situ. The film thickness is inferred from a spectroscopic ellipsometry measurement of the sam...
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